Bloomington, IN, United States of America

Chuhua Wang

This inventor holds 1 USPTO granted patent. Top assignees: Electronics and Telecommunications Research Institute, Indiana University. Active years: 2026.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Chuhua Wang: Innovator in Depth Information Estimation

Introduction

Chuhua Wang is a notable inventor based in Bloomington, IN (US). He has made significant contributions to the field of image processing, particularly in estimating depth information from images. With a total of 1 patents, his work has garnered attention for its innovative approaches and practical applications.

Latest Patents

Wang's latest patents focus on methods and apparatuses for estimating depth information of images. One of the key aspects of his patented method involves providing a confidence map for a ground truth depth map. This method also includes learning a depth information estimation model that utilizes both the ground truth depth map and the confidence map to enhance the accuracy of depth estimation.

Career Highlights

Throughout his career, Chuhua Wang has worked with esteemed organizations such as the Electronics and Telecommunications Research Institute and Indiana University. His experience in these institutions has allowed him to develop and refine his innovative techniques in image processing.

Collaborations

Wang has collaborated with talented individuals in his field, including Vibhas Kumar Vats and Shaurya Shubham. These collaborations have contributed to the advancement of his research and the successful development of his patents.

Conclusion

Chuhua Wang's contributions to the field of depth information estimation highlight his innovative spirit and dedication to advancing technology. His work continues to influence the way depth information is processed in images, showcasing the importance of his inventions in the industry.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…