Chandler, AZ, United States of America

Chuck Min Lee

This inventor holds 1 USPTO granted patent. Top assignee: Litton Systems, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chuck Min Lee. Retrieved from https://idiyas.com/inventor/chuck-min-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Chuck Min Lee - Innovator in Image Intensification Technology

Introduction

Chuck Min Lee is a notable inventor based in Chandler, AZ (US). He has made significant contributions to the field of image intensification technology. His innovative work has led to the development of a patent that enhances the performance and reliability of image intensifiers.

Latest Patents

Chuck Min Lee holds a patent for an "Image Intensifier with Improved Electromagnetic Compatibility." This invention features a photocathode with a face plate, along with a conductive layer disposed outwardly from the face plate. A grounded conductor is electrically coupled to the conductive layer, ensuring effective grounding and improved electromagnetic compatibility.

Career Highlights

Chuck Min Lee is associated with Litton Systems, Inc., where he has applied his expertise in developing advanced imaging technologies. His work has been instrumental in enhancing the capabilities of image intensifiers used in various applications.

Collaborations

Throughout his career, Chuck has collaborated with talented individuals such as Duke L Hogan and Michael R Saldaña. These partnerships have contributed to the successful development of innovative technologies in the field.

Conclusion

Chuck Min Lee's contributions to image intensification technology exemplify the impact of innovation in enhancing imaging systems. His patent and work at Litton Systems, Inc. reflect his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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