Beijing, China

Chuanting Wang

This inventor holds 6 USPTO granted patents and 9 published patent applications, plus 1 CIPO patent and 5 EPO patents. Top assignee: Huawei Technologies Co., Limited. Active years: 2016-2024.

USPTO Granted Patents = 6 

% Patents Active = 83.3


 

Average Co-Inventor Count = 2.8

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2016-2024

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6 patents (USPTO):Explore Patents

Title: Innovations of Chuanting Wang

Introduction

Chuanting Wang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of database systems, holding a total of six patents. His work focuses on enhancing data read/write methods and fault repair techniques for database systems.

Latest Patents

One of his latest patents is a data read/write method and apparatus for databases. This method involves establishing a connection to a client, determining the appropriate tablespace, and processing read/write requests efficiently. Another notable patent is related to fault repair methods for database systems. This method allows a master node to back up modified pages to a global buffer pool using a low-latency data transmission protocol. In the event of a master node failure, a standby node can quickly recover without needing to replay all logs, thus improving system reliability.

Career Highlights

Chuanting Wang is currently employed at Huawei Technologies Co., Limited, where he continues to innovate in the field of database technology. His expertise in data management and system reliability has positioned him as a key figure in his organization.

Collaborations

He has collaborated with notable colleagues, including Yuanyuan Nie and Huijun Liu, contributing to various projects that enhance database performance and reliability.

Conclusion

Chuanting Wang's innovative work in database systems has led to significant advancements in data management and fault tolerance. His contributions continue to shape the future of technology in this field.

Profile summary based on public USPTO records.
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