This inventor holds 1 USPTO granted patent and 1 EPO patent. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Years Active: 2024
Title: Chuanlin Li: Innovator in Temperature Measurement Technology
Introduction
Chuanlin Li is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of biometric parameter measurement, particularly in temperature measurement technologies. His innovative work has led to the development of a patent that enhances the accuracy of temperature measurements.
Latest Patents
Chuanlin Li holds a patent for a temperature measurement circuit, a temperature and light intensity measurement circuit, a temperature measurement method, and a temperature and light intensity measurement method. This patent relates to the field of biometric parameter measurement and involves obtaining a temperature signal based on the output voltage of a differential amplifier circuit. The method improves measurement accuracy by utilizing various configurations of the differential amplifier circuit, including connections to calibration resistors and thermistors.
Career Highlights
Throughout his career, Chuanlin Li has worked with notable companies such as Shenzhen Mindray Bio-medical Electronics Co., Ltd. and Shenzhen Mindray Scientific Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative technologies in the biomedical field.
Collaborations
Chuanlin Li has collaborated with talented individuals in his field, including Fulin Li and Haixiang Wang. These collaborations have contributed to the advancement of his research and the successful development of his patented technologies.
Conclusion
Chuanlin Li's contributions to temperature measurement technology demonstrate his commitment to innovation and excellence in the field of biometric parameter measurement. His work continues to influence advancements in this important area of research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile