Los Altos, CA, United States of America

Chu N Ying

This inventor holds 1 USPTO granted patent. Top assignee: Lsi Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chu N Ying. Retrieved from https://idiyas.com/inventor/chu-n-ying

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Chu N Ying

Introduction

Chu N Ying is a notable inventor based in Los Altos, California. He has made significant contributions to the field of data recovery technology. His innovative approach has led to the development of a unique patent that addresses challenges in data retrieval.

Latest Patents

Chu N Ying holds a patent titled "Data recovery using no sync mark retry." This invention involves a read channel configured to receive a data fragment from storage media, which may be missing a sync mark. The process includes selecting a position in the data fragment, assuming a sync mark at that position, and processing the data to determine if it converges. If the data converges, it can be successfully recovered. This patent showcases his expertise in enhancing data recovery methods.

Career Highlights

Chu N Ying is currently employed at LSI Corporation, where he applies his skills in data recovery and technology innovation. His work at LSI Corporation has allowed him to contribute to advancements in storage solutions and data management.

Collaborations

Some of his notable coworkers include Johnson Yen and Herjen Wang. Their collaboration within the company fosters an environment of innovation and creativity, leading to impactful technological advancements.

Conclusion

Chu N Ying's contributions to data recovery technology exemplify his innovative spirit and dedication to solving complex problems. His patent reflects a significant advancement in the field, and his work continues to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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