Company Filing History:
Years Active: 1991
Title: Innovations by Christopher Yih in Integrated Circuit Testing
Introduction
Christopher Yih is an accomplished inventor based in Cupertino, California, known for his significant contribution to the field of integrated circuit testing. With one patent to his name, Yih has developed a cutting-edge technology that enhances the accuracy and efficiency of circuit testing.
Latest Patents
Yih's patent, titled "CAD Driven Microprobe Integrated Circuit Tester," presents a novel system for testing integrated circuits. This invention utilizes a mechanical microprobe in conjunction with the integrated circuit's Computer-Aided Design (CAD) database. After performing an initial alignment between the database and the circuit under test, the microprobe can automatically navigate to designated points on the circuit by selecting locations within the CAD database. A sophisticated contact sensing circuit ensures the probe can safely make contact with the circuit, allowing for precise measurements or the injection of test signals without risking damage. This versatile system offers multiple modes for circuit visualization, greatly assisting engineers in their debugging and testing processes.
Career Highlights
Christopher Yih is currently associated with Knights Technology, Inc., where he continues to innovate and advance the field of electronic testing. His work exemplifies the integration of design and testing in electronic engineering, positioning him as a key figure in the evolution of testing methodologies.
Collaborations
Throughout his career, Yih has collaborated with notable colleagues such as Tsen-Shau Yang and Kuang-Hua Ken Huang. These partnerships highlight a collaborative spirit in the pursuit of advancing technology within the realm of circuit design and testing.
Conclusion
Christopher Yih's innovative contributions, particularly through his patent for the CAD Driven Microprobe Integrated Circuit Tester, underscore the importance of integrating design and testing in modern electronics. His work not only reflects a significant achievement in engineering but also promises to influence future developments in circuit testing technologies.
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