San Ramon, CA, United States of America

Christopher M Pohlhammer


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2004-2007

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2 patents (USPTO):Explore Patents

Certainly! Here is the article about inventor Christopher M Pohlhammer:

Title: Unraveling Innovation: The Ingenious Mind of Christopher M Pohlhammer

Introduction:

Christopher M Pohlhammer, a distinguished inventor based in San Ramon, CA, has made significant contributions to the field of substrate surface mapping and thickness determination through his groundbreaking patents. With a keen eye for detail and a passion for solving complex problems, Pohlhammer has solidified his place as a trailblazer in the world of technological advancements.

Latest Patents:

Pohlhammer's latest patents showcase his expertise in patterned substrate surface mapping and substrate thickness determination. His innovative method for measuring substrate characteristics involves correcting pattern-induced errors in displacement measurements, thereby revolutionizing substrate stress analysis equipment and overcoming challenges related to deposition patterns on substrates.

Career Highlights:

Currently affiliated with KLA-Tencor Technologies Corporation, Pohlhammer continues to push the boundaries of innovation within the industry. His two patents stand as a testament to his prowess in developing cutting-edge solutions that address critical issues in the field of technology.

Collaborations:

Throughout his career, Pohlhammer has collaborated with esteemed professionals in the industry, including Gary Janik and Liang-Guo Wang. Together, they have worked on projects aimed at advancing the realm of substrate surface mapping and thickness determination, contributing to the growth and evolution of the field.

Conclusion:

In conclusion, Christopher M Pohlhammer's inventive spirit and unwavering dedication to innovation have propelled him to the forefront of technological advancements. His pioneering work in substrate surface mapping and thickness determination serves as a beacon of inspiration for aspiring inventors and underscores his invaluable contributions to the industry.

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