Mountain View, CA, United States of America

Christopher-James A V Yakym

This inventor holds 1 USPTO granted patent. Top assignee: Grail, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher-James A V Yakym. Retrieved from https://idiyas.com/inventor/christopher-james-a-v-yakym

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Christopher-James A V Yakym: Innovator in Contamination Detection Technology

Introduction

Christopher-James A V Yakym is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of contamination detection through his innovative patent. His work focuses on utilizing advanced neural network techniques to enhance contamination analysis.

Latest Patents

Yakym holds a patent titled "Systems and methods for using a convolutional neural network to detect contamination." This patent describes a method for training a convolutional neural network for contamination analysis. The process involves obtaining a training dataset that includes variant allele frequencies and contamination indications for various subjects. The method constructs channels for training subjects and utilizes these channels to train the neural network effectively.

Career Highlights

Christopher-James A V Yakym is currently employed at Grail, Inc., where he applies his expertise in machine learning and contamination detection. His innovative approach has the potential to significantly improve contamination analysis in various applications.

Collaborations

Yakym collaborates with Onur Sakarya, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Christopher-James A V Yakym is a pioneering inventor whose work in convolutional neural networks is shaping the future of contamination detection technology. His contributions are vital to the ongoing advancements in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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