Skokie, IL, United States of America

Christopher D Mah

This inventor holds 1 USPTO granted patent. Top assignee: Vivum Nexus LLC. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher D Mah. Retrieved from https://idiyas.com/inventor/christopher-d-mah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Christopher D. Mah and Non-Invasive Analyte Measurement.

Introduction

Christopher D. Mah is an inventor associated with Skokie, Illinois, and Vivum Nexus LLC. His patent work includes a device and method for measuring analyte concentrations without invasive sampling.

Latest Patents

Mah is credited with 1 patent: “Method and Device for Analyte Measurement.” The invention uses narrow-band light sources at different wavelengths to measure the concentration of one or more analytes in a living subject or biological sample. Its system controls the timing and intensity of the light sources, passes light through the subject or sample, measures the transmitted light, and relates that measurement to the analyte concentration. The sources can switch rapidly between two intensity levels, while the number of sources and their wavelengths depend on the analyte being measured.

Career Highlights

Mah’s patent reflects work on optical measurement technology designed to assess analytes without invasive procedures. He is associated with Vivum Nexus LLC.

Collaborations

Joel Orlinsky and Dilip Mehta are identified as Mah’s coworkers. The available information does not specify their roles in the patent or the invention.

Conclusion

Christopher D. Mah’s patent describes a configurable optical approach to non-invasive analyte measurement, connecting his inventive work with Vivum Nexus LLC.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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