This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 2022.
Company Filing History:
Years Active: 2022
Title: Christopher C Moll - Innovator in Microelectromechanical Systems
Introduction
Christopher C Moll is a notable inventor based in San Jose, California. He has made significant contributions to the field of microelectromechanical systems (MEMS) through his innovative patent. His work focuses on enhancing the performance and reliability of sensors, particularly accelerometers.
Latest Patents
Christopher C Moll holds a patent titled "Method for reducing bias drift in a microelectromechanical systems sensor." This patent presents a method for reducing bias drift in electrical-mechanical systems sensors, such as accelerometers. The method involves arranging at least one accelerometer in a chamber and initiating a series of temperature cycle sets. Each cycle set has defined minimum and maximum temperatures, along with a ramp rate. The conditioning method monitors the accelerometers until the bias drift stabilizes within a desired range. This innovative approach not only accelerates the stabilization of bias drift but also minimizes degradation.
Career Highlights
Christopher C Moll is associated with the United States Department of the Navy, where he contributes his expertise in sensor technology. His work has been instrumental in advancing the capabilities of MEMS sensors, which are critical in various applications, including navigation and motion detection.
Collaborations
Throughout his career, Christopher has collaborated with esteemed colleagues such as Ahmed S Zaki and William H Slater. These collaborations have fostered a productive environment for innovation and development in sensor technology.
Conclusion
Christopher C Moll is a distinguished inventor whose work in microelectromechanical systems has led to advancements in sensor technology. His innovative methods for reducing bias drift in accelerometers demonstrate his commitment to enhancing the reliability and performance of these critical devices.