logo

For the Inventor, By the Inventor

Brighton, MA, United States of America

Christopher C Cunningham

This inventor holds 11 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Aware, Inc., Broadcom Corporation. Active years: 2005-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christopher C Cunningham. Retrieved from https://idiyas.com/inventor/christopher-c-cunningham-xj5ofdro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 11 

% Patents Active = 36.4

 

Average Co-Inventor Count = 1.5

ph-index = 3

Forward Citations = 28(Granted Patents)


Location History:

  • Brighton, MA (US) (2005 - 2015)
  • Belmont, MA (US) (2009 - 2016)

Company Filing History:

goldMedal7 out of 209 
 
Aware, Inc.
 patents
silverMedal4 out of 11,124 
 
Broadcom Corporation
 patents

Years Active: 2005-2016

Loading Chart...
Loading Chart...
11 patents (USPTO):Explore Patents
1. 9270331 - Method and system for detecting non-linear devices (2016-02-23),
2. 9137085 - Adjusting controls at the physical layer to control link quality at higher layers (2015-09-15),
3. 9130655 - Methods and systems for detecting metallic faults affecting communications links (2015-09-08),
4. 9054794 - Detecting faults affecting communications links (2015-06-09),
5. 8743938 - Detecting faults affecting communications links (2014-06-03),
6. 8611405 - Detecting faults affecting communications links (2013-12-17),
7. 8559532 - Method and system for detecting non-linear devices (2013-10-15),
8. 7786737 - Modeling and calibrating a three-port time-domain reflectometry system (2010-08-31),
9. 7580471 - Nonlinear device detection (2009-08-25),
10. 7521938 - Modeling and calibrating a three-port time-domain reflectometry system (2009-04-21),
11. 6842012 - Modeling and calibrating a three-port time-domain reflectometry system (2005-01-11),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…