This inventor holds 4 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignee: Nokia Technologies Oy. Active years: 2015-2022.
Location History:
- Ely, GB (2015)
- Cambridge, GB (2019 - 2022)
Company Filing History:
Years Active: 2015-2022
Title: Christopher Bower: Innovator in Biometric Measurement and Two-Dimensional Materials
Introduction
Christopher Bower is a notable inventor based in Cambridge, GB. He has made significant contributions to the field of technology, particularly in biometric measurement and the development of two-dimensional materials. With a total of 4 patents to his name, Bower continues to push the boundaries of innovation.
Latest Patents
Bower's latest patents include an "Apparatus for biometric measurement." This apparatus comprises at least one light source and at least one photodetector, along with a first layer of optical material designed to embed the light source. Additionally, a second layer of optical material is configured to embed the photodetector. The design ensures that light from the source does not directly reach the photodetector, while still guiding light towards it. Another significant patent is the "Apparatus and method of forming an apparatus comprising two-dimensional material." This method involves transferring a layer of two-dimensional material from a liquid surface onto a layer of woven electronic fabric, which consists of both conductive and non-conductive strands, forming a sensor.
Career Highlights
Christopher Bower is currently employed at Nokia Technologies Oy, where he applies his expertise in developing innovative technologies. His work has been instrumental in advancing the capabilities of biometric systems and electronic materials.
Collaborations
Bower has collaborated with notable colleagues, including Stefano Marco Borini and Richard White. Their combined efforts contribute to the innovative projects at Nokia Technologies Oy.
Conclusion
Christopher Bower is a prominent figure in the realm of innovation, with a focus on biometric measurement and two-dimensional materials. His patents reflect his commitment to advancing technology and improving the functionality of electronic devices.