Juelich, Germany

Christoph Buchal

This inventor holds 5 USPTO granted patents. Top assignee: Forschungszentrum Julich Gmbh. Active years: 1992-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christoph Buchal. Retrieved from https://idiyas.com/inventor/christoph-buchal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.1

ph-index = 3

Forward Citations = 68(Granted Patents)


Location History:

  • Julich, DE (1992 - 1999)
  • Julich-Barmen, DE (1999)

Company Filing History:


Years Active: 1992-1999

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5 patents (USPTO):Explore Patents

Title: Christoph Buchal: Innovator in Optoelectronics

Introduction

Christoph Buchal is a prominent inventor based in Juelich, Germany. He has made significant contributions to the field of optoelectronics, holding a total of 5 patents. His work focuses on innovative methods and applications that enhance the functionality of electronic components.

Latest Patents

Among his latest patents is a method of producing a layer structure, which has applications in optoelectronic diodes and components containing the same. These inventions reflect his commitment to advancing technology in the optoelectronic sector.

Career Highlights

Christoph Buchal is associated with Forschungszentrum Jülich GmbH, a leading research center in Germany. His role at this institution has allowed him to explore and develop cutting-edge technologies that push the boundaries of current optoelectronic applications.

Collaborations

He has collaborated with notable colleagues such as Jurgen Schubert and Willi Zander, contributing to a dynamic research environment that fosters innovation and creativity.

Conclusion

Christoph Buchal's work in optoelectronics exemplifies the spirit of innovation and dedication to advancing technology. His contributions through patents and collaborations continue to impact the field significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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