Neuenburg, Switzerland

Christoph Aebi

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Mettler-Toledo Gmbh. Active years: 1999-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christoph Aebi. Retrieved from https://idiyas.com/inventor/christoph-aebi-ikyi99xh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 12(Granted Patents)


Location History:

  • Buttenried b. Muhleberg, CH (1999)
  • Neuenburg, CH (2005)

Company Filing History:


Years Active: 1999-2005

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2 patents (USPTO):Explore Patents

Title: Christoph Aebi: Innovator in Titration Technology

Introduction

Christoph Aebi is a notable inventor based in Buttenried b. Muhleberg, Switzerland. He has made significant contributions to the field of titration technology, showcasing his expertise through his innovative designs and patents.

Latest Patents

Christoph Aebi holds a patent for a titrating device, which reflects his commitment to advancing laboratory technology. This invention is a testament to his skills and understanding of the complexities involved in titration processes.

Career Highlights

Aebi is currently employed at Mettler-Toledo GmbH, a company renowned for its precision instruments and laboratory equipment. His role at Mettler-Toledo allows him to apply his inventive skills in a practical setting, contributing to the development of cutting-edge solutions in the industry.

Collaborations

Some of Christoph Aebi's coworkers include Remy C Jacquet and Yves Marmier. Their collaboration fosters a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Christoph Aebi's work in titration technology exemplifies the impact of innovation in scientific research. His contributions continue to influence the field, making him a significant figure in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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