Christine Odero

Title: Christine Odero: Innovator in Integrated Circuit Testing

Introduction

Christine Odero is a prominent inventor based in Sunnyvale, CA. She has made significant contributions to the field of integrated circuit design through her innovative patent. With a focus on enhancing testing methodologies, Christine's work is vital for the advancement of electronic engineering.

Latest Patents

Christine holds a patent for "Automated alternating current characterization testing." This patent discloses methods and computer-readable media containing program instructions for testing alternating current characteristics of a computer model of an integrated circuit design. The testing implements an associated AVF file and an associated DUT file for the integrated circuit design. The computer-readable media includes various program instructions for generating test files, parsing chip files, extracting information, and simulating physical test stations. This innovation is crucial for improving the accuracy and efficiency of integrated circuit testing.

Career Highlights

Christine is currently employed at Adaptec, Inc., where she continues to develop her expertise in integrated circuit design and testing. Her work has positioned her as a key player in the field, contributing to advancements that benefit the industry as a whole.

Collaborations

Christine collaborates with notable colleagues, including Bruce Pember and Honda Yang. Their teamwork fosters an environment of innovation and creativity, leading to groundbreaking developments in their projects.

Conclusion

Christine Odero's contributions to integrated circuit testing through her patent demonstrate her commitment to innovation in technology. Her work not only enhances the testing processes but also sets a standard for future advancements in the field.