The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Jan. 25, 1999
Applicant:
Inventors:

Bruce Pember, San Jose, CA (US);

Christine Odero, Sunnyvale, CA (US);

Honda Yang, Santa Clara, CA (US);

Assignee:

Adaptec, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

Disclosed are methods and computer readable media containing program instructions for testing alternating current characteristics of a computer model of an integrated circuit design. The testing implements an associated AVF file and an associated DUT file for the integrated circuit design. The computer readable media includes: (a) program instructions for generating a test file containing data of a parameter of the integrated circuit design, the test file being generated based upon whether a pair of signals are either both inputs, or one is an input and another is an output; (b) program instructions for parsing through a chip file of the integrated circuit design in order to extract netlist information, external signal names, bus definitions, and pull-up information; (c) program instructions for parsing through the DUT file to extract input/output information, channel number information, and timing information; (d) program instructions for splitting data of the AVF file into input vector data and output vector data; (e) program instructions for generating an environment file that assists in simulating a physical test station; and (f) program instructions for running the environment file using the input vector data and the output vector data in order to generate a log that indicates alternating current test results for the parameter data.


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