Company Filing History:
Years Active: 2024
Title: Christina Porter: Innovator in Complex Imaging Reflectometry and Refractometry
Introduction
Christina Porter is a distinguished inventor based in Superior, Colorado. She has made significant contributions to the field of imaging technology, particularly through her innovative patent that focuses on complex spatially-resolved reflectometry and refractometry. Her work has the potential to advance material analysis and characterization techniques.
Latest Patents
Christina Porter holds a patent for an apparatus and methods for complex imaging reflectometry and refractometry using at least partially coherent light. This technology enables the generation of quantitative images that yield spatially-dependent, local material information about a sample of interest. The images produced can provide critical material properties such as chemical composition, thickness of chemical layers, dopant concentrations, and reactions at interfaces. The method involves scattering an incident beam of VUV wavelength or shorter off a sample and imaging it at various angles, wavelengths, and polarizations. The data collected is utilized to obtain images of a sample's absolute, spatially varying, complex reflectance or transmittance, which is then used to determine spatially-resolved, depth-dependent sample material properties.
Career Highlights
Christina Porter is affiliated with the Regents of the University of Colorado, a body corporate. Her role in this institution allows her to engage in cutting-edge research and development in her field. She has demonstrated a commitment to advancing technology through her innovative approaches and methodologies.
Collaborations
Christina has collaborated with notable colleagues, including Daniel E. Adams and Michael Tanksalvala. These partnerships have likely contributed to the success and impact of her research and inventions.
Conclusion
Christina Porter is a remarkable inventor whose work in complex imaging reflectometry and refractometry is paving the way for advancements in material analysis. Her contributions are significant and reflect her dedication to innovation in technology.