Stanford, CA, United States of America

Christina K Kim

This inventor holds 2 USPTO granted patents. Top assignee: Leland Stanford Junior University. Active years: 2021-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christina K Kim. Retrieved from https://idiyas.com/inventor/christina-k-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021-2022

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2 patents (USPTO):Explore Patents

Title: Christina K Kim: Innovator in Neural Activity Measurement

Introduction

Christina K Kim is a prominent inventor based in Stanford, CA (US). She has made significant contributions to the field of neuroscience through her innovative methods and systems for measuring neural activity. With a total of 2 patents, her work is paving the way for advancements in understanding neural functions.

Latest Patents

One of Christina's latest patents is focused on a method of optically recording neural activity in one or more regions of a target tissue. This patent also includes a method for optically modulating the activity of neural tissue. The system she developed is designed to facilitate these methods, showcasing her expertise in the field.

Career Highlights

Christina K Kim is affiliated with Leland Stanford Junior University, where she continues to engage in groundbreaking research. Her work is instrumental in advancing the understanding of neural mechanisms and their applications in various fields.

Collaborations

Some of her notable coworkers include Samuel J Yang and Karl A Deisseroth, who are also recognized for their contributions to neuroscience.

Conclusion

Christina K Kim's innovative work in measuring neural activity exemplifies her dedication to advancing scientific knowledge. Her patents and research efforts are crucial for future developments in neuroscience.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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