Gevelsberg, Germany

Christian Voye

This inventor holds 2 USPTO granted patents. Top assignee: E.i. Dupont De Nemours and Company. Active years: 2003-2005.


% Patents Active = 50.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2003-2005

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Christian Voye

Introduction

Christian Voye is a notable inventor based in Gevelsberg, Germany. He has made significant contributions to the field of computer imaging, particularly in the generation of images for three-dimensional objects. With a total of 2 patents to his name, Voye's work showcases his expertise and innovative spirit.

Latest Patents

Voye's latest patents include a process for generating a computer image of a coated three-dimensional object. This process involves applying a relevant coating layer on test panels, measuring optical surface properties, and storing the data for accurate surface topography representation. His second patent focuses on generating a computer image of a three-dimensional object with a special-effect coating. This process includes angle-dependent colorimetric measurements and the assembly of polygonal areas into a visually perceptible image.

Career Highlights

Christian Voye is currently associated with E.I. du Pont de Nemours and Company, where he continues to push the boundaries of innovation in imaging technology. His work has been instrumental in enhancing the accuracy and visual appeal of computer-generated images.

Collaborations

Voye has collaborated with talented coworkers such as Marc Chilla and Paul Rupieper. Their combined efforts contribute to the advancement of technology in their field.

Conclusion

Christian Voye's innovative patents and career at E.I. du Pont de Nemours and Company highlight his significant contributions to the field of computer imaging. His work continues to inspire advancements in technology and imaging processes.

Profile summary based on public USPTO records.
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