This inventor holds 2 USPTO granted patents. Top assignee: Rohde and Schwarz Gmbh & Co. Kg. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Christian Soldner: Innovations in Hardware Maintenance and RF Measurement.
Introduction
Christian Soldner is an inventor based in Munich, Germany, whose patent work addresses hardware-system maintenance and radio-frequency measurement. He is associated with Rohde & Schwarz GmbH & Co. KG and holds 2 patents.
Latest Patents
Soldner’s listed patents focus on monitoring equipment health and improving measurement-instrument operation.
“Maintenance system and method of analyzing and/or creating health information for a hardware system” describes a system that acquires operational parameters relevant to a hardware system’s health. An analysis circuit uses those parameters to determine a device health score, estimate remaining useful life, and provide recommendations for operating the system. The patent also describes methods for analyzing or creating health information.
“Measurement instrument for measuring a radio frequency signal” concerns an instrument that receives and processes a radio-frequency signal. It obtains resource information about the received signal and uses that information to adapt an electronic component’s setting for level adjustment.
Career Highlights
Soldner’s patent portfolio reflects work on practical measurement and maintenance technologies. The inventions describe ways to use operational and signal-resource information to support equipment assessment and instrument configuration.
Collaborations
Soldner is associated with Rohde & Schwarz GmbH & Co. KG. His listed coworkers include Matthias Ruengeler and Philipp Joppich.
Conclusion
Christian Soldner’s two listed patents address hardware health analysis and adaptive radio-frequency measurement, highlighting his contributions to equipment monitoring and measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
