Junglinster, Luxembourg

Christian Patouraux

This inventor holds 1 USPTO granted patent. Top assignee: Ses Astra S.a.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christian Patouraux. Retrieved from https://idiyas.com/inventor/christian-patouraux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of Christian Patouraux

Introduction

Christian Patouraux is an accomplished inventor based in Junglinster, Luxembourg. He has made significant contributions to the field of satellite technology, particularly in the determination of yaw angles for satellites. His innovative methods have the potential to enhance satellite navigation and positioning systems.

Latest Patents

Christian Patouraux holds a patent for a "Method and apparatus for determining a calibrated value for the yaw angle of a satellite." This method allows for the determination of the yaw angle from readings of two different sensors measuring roll and/or pitch angles, even when the reference points of the sensors are not identical. While the patent primarily describes applications for geostationary satellites, the method is versatile and can be applied to satellites in various orbits, including circular and non-circular paths.

Career Highlights

Christian Patouraux is associated with SES Astra S.A., a leading satellite operator. His work at the company has allowed him to apply his innovative ideas in practical settings, contributing to advancements in satellite technology.

Collaborations

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Conclusion

Christian Patouraux's contributions to satellite technology through his innovative patent demonstrate his expertise and commitment to advancing the field. His work continues to influence satellite navigation systems and showcases the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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