Greifensee, Switzerland

Christian Liechti

This inventor holds 1 USPTO granted patent. Top assignee: Mettler Instrumente Ag. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christian Liechti. Retrieved from https://idiyas.com/inventor/christian-liechti-si02k83e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: The Innovations of Christian Liechti

Introduction

Christian Liechti is an accomplished inventor based in Greifensee, Switzerland. She has made significant contributions to the field of electronic weighing scales. Her innovative spirit is reflected in her patent, which showcases her expertise and creativity.

Latest Patents

Christian holds a patent for a display for an electronic weighing scale. This invention demonstrates her ability to enhance user experience and functionality in weighing technology. With 1 patent to her name, she has established herself as a notable figure in her field.

Career Highlights

Christian Liechti is currently employed at Mettler Instrumente AG, a company renowned for its precision instruments and weighing solutions. Her role at Mettler Instrumente AG allows her to further develop her skills and contribute to cutting-edge innovations in the industry.

Collaborations

Throughout her career, Christian has worked alongside talented individuals such as Rudolf Bachmann and Arthur Baumann. These collaborations have enriched her professional journey and fostered a creative environment for innovation.

Conclusion

Christian Liechti's contributions to the field of electronic weighing scales exemplify her dedication to innovation and excellence. Her work continues to inspire others in the industry, and her achievements are a testament to her talent and hard work.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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