Company Filing History:
1 out of 6 
1 out of 1 Years Active: 2008-2010
Title: The Innovative Contributions of Christian J Corley
Introduction
Christian J Corley is a notable inventor based in Austin, TX, who has made significant contributions to the field of nondestructive measurement technologies. With a focus on innovative methods for measuring film thickness, Corley's work has implications for various industries, including aerospace and construction. He holds 2 patents that showcase his expertise and creativity in this specialized area.
Latest Patents
Corley's latest patents revolve around the development of apparatuses and methods for nondestructive microwave measurement of dry and wet film thickness. These inventions allow for the non-invasive measurement of film thickness on structures such as vessels, aircraft, and buildings using calibrated microwave sensors. The process involves directing microwave energy toward the film, which passes through and is reflected by a substrate surface beneath it. By comparing the properties of the reflected wave with those from calibration samples of known thicknesses, the unknown thickness of the film can be accurately determined. In some embodiments, sensors are maintained at a fixed altitude above the substrate or the film, and in one case, sensors are integrated with a coating applicator to measure the thickness of the film applied.
Career Highlights
Throughout his career, Christian J Corley has worked with reputable organizations, including Systems & Materials Research Corporation. His experience in these companies has allowed him to refine his skills and contribute to groundbreaking technologies in the field of nondestructive measurement.
Collaborations
Corley has collaborated with notable colleagues such as Alan V Bray and Claude H Garrett, further enhancing the innovative potential of his projects. Their combined expertise has likely played a role in the successful development of his patented technologies.
Conclusion
Christian J Corley's contributions to nondestructive measurement technologies highlight his innovative spirit and dedication to advancing the field. His patents not only reflect his technical skills but also demonstrate the potential for practical applications in various industries.