Edewecht, Germany

Christian Heyers

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Broetje-Automation Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christian Heyers. Retrieved from https://idiyas.com/inventor/christian-heyers

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Christian Heyers and a Vibration-Assisted Machining Invention.

Introduction

Christian Heyers is an inventor associated with Edewecht, Germany, and Broetje-Automation GmbH. His listed patent concerns a machining method that combines drilling and countersinking with controlled axial vibration.

Latest Patents

Heyers is credited with 1 patent: “Method and Apparatus for Machining a Workpiece.” The invention describes drilling a workpiece and then countersinking the resulting bore with a rotating drilling/countersinking tool. As the tool advances axially, an axial vibration is superimposed on its feed movement. At a predefined point in the feed, the vibration frequency is lowered to a final machining frequency, which is maintained until the tool reaches the counterbore’s terminal position.

Career Highlights

The available information identifies Heyers as an inventor connected with Broetje-Automation GmbH. His patent focuses on coordinating tool movement and vibration frequency during a machining process.

Collaborations

The listed company association is Broetje-Automation GmbH. The provided information does not specify co-inventors or other collaborators for the patent.

Conclusion

Christian Heyers’s listed invention addresses drilling and countersinking through a controlled, vibration-assisted machining process, and is associated with Broetje-Automation GmbH.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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