Christian Balderer

Title: Christian Balderer: Innovator in Machine Condition Monitoring

Introduction

Christian Balderer is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of machine condition monitoring through his innovative patents. With a total of 2 patents, Balderer has developed methods that leverage machine learning and statistical models to enhance the monitoring of machine conditions.

Latest Patents

One of Balderer's latest patents is titled "Robust sensor correlation analysis for machine condition monitoring." This method utilizes machine learning to monitor machine conditions by calculating a correlation coefficient that is more resilient against outliers. The weights assigned to each sample indicate the likelihood of being an outlier, and the calculation is based on the Mahalanobis distance from the sample to the sample mean. Additionally, hierarchical clustering is applied to reveal group information among sensors, allowing users to obtain desired clustering results by specifying a similarity threshold.

Another significant patent is "Use of sequential nearest neighbor clustering for instance selection in machine condition monitoring." This method streamlines the selection of a representative set of training data for statistical model training in machine condition monitoring systems. By employing a nearest-neighbor sequential clustering technique in combination with a kd-tree, the method reduces the time required to choose representative samples from large datasets. A distance threshold limits the geometric size of the clusters, and each node of the kd-tree is assigned a representative sample from the training data.

Career Highlights

Christian Balderer has worked with prominent companies such as Siemens Corporation and Siemens Aktiengesellschaft. His experience in these organizations has contributed to his expertise in machine condition monitoring and related technologies.

Collaborations

Throughout his career, Balderer has collaborated with notable professionals, including Chao Yuan and Claus Neubauer. These collaborations have likely enriched his work and contributed to the development of his innovative patents.

Conclusion

Christian Balderer is a distinguished inventor whose work in machine condition monitoring has led to the development of valuable patents. His innovative approaches continue to influence the field and enhance the efficiency of machine monitoring systems.