The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Nov. 27, 2006
Applicants:

Chao Yuan, Secaucus, NJ (US);

Christian Balderer, Zurich, CH;

Tzu-kuo Huang, Taipei, TW;

Claus Neubauer, Monmouth Junction, NJ (US);

Inventors:

Chao Yuan, Secaucus, NJ (US);

Christian Balderer, Zurich, CH;

Tzu-Kuo Huang, Taipei, TW;

Claus Neubauer, Monmouth Junction, NJ (US);

Assignee:

Siemens Corporation, Isein, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for monitoring machine conditions is based on machine learning through the use of a statistical model. A correlation coefficient is calculated using weights assigned to each sample that indicate the likelihood that that sample is an outlier. The resulting correlation coefficient is more robust against outliers. The calculation of the weight is based on the Mahalanobis distance from the sample to the sample mean. Additionally, hierarchical clustering is applied to intuitively reveal group information among sensors. By specifying a similarity threshold, the user can easily obtain desired clustering results.


Find Patent Forward Citations

Loading…