Natick, MA, United States of America

Christain Bourdin

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Invensys Systems, Inc.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Christain Bourdin. Retrieved from https://idiyas.com/inventor/christain-bourdin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Christain Bourdin: Innovator in Fault-Tolerant Data Transfer

Introduction

Christain Bourdin is a notable inventor based in Natick, MA (US). He has made significant contributions to the field of data transfer technology. His innovative approach focuses on enhancing the reliability of data transmission systems.

Latest Patents

Bourdin holds a patent for a fault-tolerant data transfer system. This control system features a first module that includes a memory and diagnostic logic. The diagnostic logic periodically tests selected locations in the memory, reading and writing data to ensure integrity. A second module is coupled to the first, allowing for the transfer of written back data, ensuring that it is properly identified upon receipt.

Career Highlights

Christain Bourdin is currently employed at Invensys Systems, Inc., where he continues to develop cutting-edge technologies. His work has been instrumental in advancing data transfer systems, making them more robust and reliable.

Collaborations

Bourdin has collaborated with notable colleagues such as Gene Cummings and Alan Andrew Gale. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Christain Bourdin's innovative work in fault-tolerant data transfer systems exemplifies his commitment to advancing technology. His contributions have the potential to significantly impact the reliability of data transmission in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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