Chris Therrien

Title: Chris Therrien: Innovator in Fault Testing Technology

Introduction

Chris Therrien is an accomplished inventor based in Trophy Club, TX (US). He has made significant contributions to the field of fault testing technology, particularly through his innovative patent. His work focuses on enhancing the reliability and efficiency of built-in self-testing (BIST) systems.

Latest Patents

Chris Therrien holds a patent for "Path-based crosstalk fault test scanning in built-in self-testing." This patent introduces a path-based crosstalk fault model that works in conjunction with BIST and software for automatic test pattern generation. The solution enables the generation of test patterns that maximize switching activity, as well as inductive and capacitive crosstalk. The path-based fault model specifically targets the cumulative effects of crosstalk along a particular net, referred to as the 'victim' path, in contrast to the discrete nets used in traditional fault models. This innovative approach allows for full controllability of the target paths and any associated aggressors, facilitating defect detection and silicon validation of delay defects on long parallel nets.

Career Highlights

Chris Therrien is currently employed at Texas Instruments Corporation, where he continues to develop and refine technologies that enhance testing methodologies. His expertise in fault testing has positioned him as a valuable asset within the company.

Collaborations

Throughout his career, Chris has collaborated with talented individuals such as Xiao Liu and Corey Jason Goodrich. These partnerships have contributed to the advancement of testing technologies and have fostered a collaborative environment for innovation.

Conclusion

Chris Therrien's contributions to fault testing technology exemplify the impact of innovative thinking in engineering. His patent and work at Texas Instruments Corporation highlight his commitment to improving testing methodologies in the industry.