Horsham, United Kingdom

Chris Inkpen

This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignee: Honeywell International Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chris Inkpen. Retrieved from https://idiyas.com/inventor/chris-inkpen-8r9dt49c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Chris Inkpen: Innovator in Virtual Meter Calculations

Introduction

Chris Inkpen is a notable inventor based in Horsham, GB. He has made significant contributions to the field of virtual meter calculations, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of data processing in metering systems.

Latest Patents

Chris Inkpen holds a patent titled "Methods and systems for detecting formula loops in virtual meter calculations." This patent describes a method and system for detecting formula loops in virtual meter calculations. The method involves receiving a set of data associated with physical and virtual meters, creating a dependency network, obtaining a transitive closure matrix, analyzing the matrix in real-time, and generating alarms for users upon identifying non-zero values.

Career Highlights

Chris Inkpen is currently associated with Honeywell International Inc., where he applies his expertise in metering technologies. His role involves developing innovative solutions that improve the functionality and reliability of metering systems.

Collaborations

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Conclusion

Chris Inkpen's contributions to the field of virtual meter calculations exemplify the impact of innovative thinking in technology. His patent reflects a commitment to advancing metering systems, showcasing his role as a key inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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