Mountain View, CA, United States of America

Chris Ellingham


Average Co-Inventor Count = 3.6

ph-index = 3

Forward Citations = 186(Granted Patents)


Company Filing History:


Years Active: 1999-2000

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3 patents (USPTO):Explore Patents

Title: Chris Ellingham: Innovator in Integrated Circuit Design

Introduction

Chris Ellingham is a prominent inventor based in Mountain View, CA (US). He has made significant contributions to the field of integrated circuit design, holding a total of 3 patents. His work focuses on enhancing design for test applications, which is crucial for the development of reliable electronic devices.

Latest Patents

One of Chris Ellingham's latest patents is titled "Hierarchical scan architecture for design for test applications." This innovative system and method architect design for test circuitry within integrated circuit designs that include subdesigns. The system features both a default operational mode and a user-specified operational mode. It allows for the definition of subdesign scan chains that can be linked together to create complex scan chains. The system encompasses specification, analysis, synthesis, and reporting processes, facilitating the design of integrated circuits with hierarchical structures.

Career Highlights

Chris Ellingham is currently employed at Synopsys, Inc., where he continues to push the boundaries of integrated circuit design. His expertise in architecting design for test circuitry has positioned him as a key player in the industry. His innovative approaches have led to advancements that improve the efficiency and effectiveness of integrated circuit testing.

Collaborations

Chris has collaborated with notable colleagues, including James Beausang and Robert L. Walker. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies in the field of integrated circuits.

Conclusion

Chris Ellingham's contributions to integrated circuit design through his innovative patents and collaborations highlight his importance in the field. His work continues to influence the future of electronic device reliability and performance.

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