Seoul, South Korea

Choon K Zhoh

This inventor holds 1 USPTO granted patent. Top assignee: Osan College. Active years: 2001.


% Patents Active = 100.0

Average Co-Inventor Count = 13.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2001

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Choon K Zhoh in Foot Arch Measurement

Introduction

Choon K Zhoh is an innovative inventor based in Seoul, South Korea. He has made significant contributions to the field of foot measurement technology. His work focuses on developing methods that enhance the precision and ease of measuring foot arch heights.

Latest Patents

Choon K Zhoh holds a patent for a method of measuring the height of a foot arch. This method allows for precise and easy measurement using two essential heights of the foot arch. The process begins with creating a foot cast by pouring plaster into a foot mold. Subsequently, two intersecting points are determined through specific lines drawn on the foot. The first height is measured from a flat base level to the first intersecting point, while the second height is measured to the second intersecting point.

Career Highlights

Choon K Zhoh is affiliated with Osan College, where he contributes to the academic and practical understanding of foot measurement techniques. His innovative approach has garnered attention in the field, showcasing his commitment to improving measurement accuracy.

Collaborations

Choon K Zhoh has worked alongside notable colleagues, including Eun Kyung Lee and Dong H Kim. Their collaborative efforts have further advanced the research and application of foot arch measurement methods.

Conclusion

Choon K Zhoh's contributions to the field of foot arch measurement exemplify the importance of innovation in enhancing precision in medical and athletic applications. His patent reflects a significant advancement in the methodology of foot arch measurement, showcasing his dedication to improving this area of study.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…