Chong Li

Title: The Innovative Contributions of Chong Li

Introduction

Chong Li is a notable inventor based in Shijiazhuang, China. He has made significant contributions to the field of terahertz on-wafer measurement through his innovative patent. His work focuses on enhancing the accuracy of high-frequency measurements, which is crucial for various technological applications.

Latest Patents

Chong Li holds a patent for an "On-wafer S-parameter calibration method." This method provides a new approach to S-parameter calibration, which is essential for accurate measurements in high-frequency applications. The process involves performing two-port calibration on a waveguide end face when a probe is not connected to a test system. It also includes one-port calibration on each of the two probe end faces when the probe is connected. Additionally, he developed a crosstalk calibration standard that matches the length of the device under test, allowing for precise correction of crosstalk errors in the measurement process. This innovation significantly improves the accuracy of error correction in high-frequency on-wafer S-parameter measurements.

Career Highlights

Chong Li has had a distinguished career, working at the 13th Research Institute of China Electronics and the 13th Research Institute of China Electronics Technology Group Corporation. His experience in these institutions has allowed him to develop and refine his innovative techniques in the field of electronics and measurement.

Collaborations

Chong Li has collaborated with notable colleagues, including Aihua Wu and Chen Liu. Their combined expertise has contributed to advancements in the field and has fostered a collaborative environment for innovation.

Conclusion

Chong Li's contributions to the field of terahertz on-wafer measurement through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances measurement accuracy but also paves the way for future innovations in high-frequency applications.