Taoyuan, Taiwan

Chingting Chiu

This inventor holds 1 USPTO granted patent and 9 published patent applications. Top assignee: Polytronics Technology Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chingting Chiu. Retrieved from https://idiyas.com/inventor/chingting-chiu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chingting Chiu and Over-Current Protection Technology

Introduction

Chingting Chiu is an inventor based in Taoyuan, Taiwan. His work includes an invention designed to help protect electrical circuits from excessive current.

Latest Patents

Chiu is associated with 1 patent, titled “Over-current protection device.” The device has an electrode layer and a heat-sensitive layer laminated between its top and bottom metal layers. The heat-sensitive layer exhibits a positive temperature coefficient (PTC) characteristic and contains a polymer matrix with a first fluoropolymer, along with conductive filler made of carbon black and a metal compound. The design provides a resistance jump-starting temperature between 184°C and 192°C, while the conductive filler forms an electrically conductive path through the heat-sensitive layer.

Career Highlights

Chiu is associated with Polytronics Technology Corporation. His patented work focuses on a PTC-based over-current protection device and its material composition.

Collaborations

Chia-yuan Lee and Hsiu-che Yen are identified as Chiu’s coworkers. The available information does not specify their roles in the patent or their contributions to the invention.

Conclusion

Chingting Chiu’s patent describes a polymer-based PTC device intended to provide over-current protection, with its fluoropolymer matrix and conductive filler central to its design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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