Tainan, Taiwan

Ching-Yuan Chang

This inventor holds 1 USPTO granted patent. Top assignees: National Applied Research Laboratories, National Taiwan University. Active years: 2011.


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ching-Yuan Chang: Innovator in Lens Measurement Technology

Introduction

Ching-Yuan Chang is a notable inventor from Taiwan, recognized for his contributions to lens measurement technology. His innovative approach has led to the development of a unique lens measuring device that simplifies the process of analyzing lens characteristics.

Latest Patents

Ching-Yuan Chang holds a patent for a lens measuring device and method applied therein. This device comprises a light source, a first polarizer, a second polarizer, and an image analysis module. The method involves enabling the light source to pass through the first polarizer, the lens to be measured, and the second polarizer, generating a light beam for analysis. The image analysis module then deduces the structural center and energy distribution of the lens, allowing for the assessment of errors in polarity and skewness. This innovative method eliminates the need for complicated corrections typically required with conventional collimating laser light sources, enabling simultaneous testing of multiple lenses.

Career Highlights

Ching-Yuan Chang has worked at prestigious institutions such as National Taiwan University and National Applied Research Laboratories. His experience in these organizations has contributed significantly to his expertise in lens measurement technology.

Collaborations

Ching-Yuan Chang has collaborated with notable colleagues, including Chien-Ching Ma and Kuo-Cheng Huang. Their combined efforts have further advanced the field of lens measurement.

Conclusion

Ching-Yuan Chang's innovative lens measuring device represents a significant advancement in optical technology. His work continues to influence the industry and improve lens analysis methods.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…