Chin Chai Gan

Title: Innovations by Chin Chai Gan

Introduction

Chin Chai Gan is a notable inventor based in Malacca, Malaysia. He has made significant contributions to the field of electrical testing, particularly in semiconductor devices. With a total of 2 patents, his work has garnered attention for its innovative approaches and practical applications.

Latest Patents

One of his latest patents is a spring-based probe pin that allows for Kelvin testing. This invention enables the measurement or control of voltage at a node of an integrated circuit using a two-wire Kelvin contact with spring-based probe pins. By offsetting and tapering the lower end section of the spring-based probe pin, multiple pins can be connected to a single contact bump, such as a solder bump. Another significant patent is the bilevel probe, which provides an apparatus for electrical testing of semiconductor devices. This invention includes a printed circuit board with a first plurality of probe pins for probing bump connectors and a second plurality of probe pins for probing probe pads, both electrically and mechanically connected to the board.

Career Highlights

Chin Chai Gan is currently employed at National Semiconductor Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of electrical testing in the semiconductor industry.

Collaborations

He has collaborated with notable coworkers, including Sek Hoi Chong and Tze Kang Tang, contributing to a dynamic and innovative work environment.

Conclusion

Chin Chai Gan's contributions to the field of electrical testing and semiconductor devices highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving measurement techniques and enhancing the efficiency of electrical testing.