Company Filing History:
Years Active: 2022-2024
Title: Chikashi Nakai: Innovator in Automatic Analysis Technology
Introduction
Chikashi Nakai is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of automatic analysis technology, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of measurement processes in various applications.
Latest Patents
Nakai's latest patents include an "Automatic Analysis Apparatus" and an "Automatic Analyzer and Automatic Analysis Method." The Automatic Analysis Apparatus features a measurement portion that includes a containment unit with multiple containers for liquids, a dispensing unit with a dispensing probe, and a gauging portion to measure the dispensed liquid. It also incorporates an excessive immersion determination portion to ensure that the dispensing probe does not exceed a predetermined immersion range. The measurement control portion is designed to manage the measurement process based on the selected mode.
The Automatic Analyzer and Automatic Analysis Method patent describes an automatic analyzer that consists of several storage container holding units, a dispensing container holding unit, and multiple dispensing devices. Each dispensing device is equipped with a dispensing probe and a dispensing abnormality detector. The drive control unit manages the operation of each dispensing device based on the detection results, ensuring that any abnormalities are addressed effectively.
Career Highlights
Chikashi Nakai is currently employed at Jeol Ltd., a company known for its advanced scientific instruments and analytical equipment. His work at Jeol Ltd. has allowed him to develop innovative solutions that enhance the capabilities of automatic analysis systems.
Collaborations
Nakai collaborates with talented colleagues, including Makoto Asakura and Mine Yamashita. Their combined expertise contributes to the advancement of technology in their field.
Conclusion
Chikashi Nakai's contributions to automatic analysis technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of measurement processes and a dedication to improving analytical methods.