Osaka, Japan

Chikashi Hayashi

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignees: Panasonic Corporation, Panasonic Intellectual Property Management Co., Ltd.. Active years: 2011-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chikashi Hayashi. Retrieved from https://idiyas.com/inventor/chikashi-hayashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 1.5

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Takatsuki, JP (2011)
  • Osaka, JP (2018)

Company Filing History:


Years Active: 2011-2018

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2 patents (USPTO):Explore Patents

Title: Chikashi Hayashi - Innovator in Information Recording Technology

Introduction

Chikashi Hayashi is an inventor based in Takatsuki-shi, Japan. He has made contributions to the field of information recording and reproducing technology. Although he currently holds no granted patents, his innovative ideas are reflected in his patent applications.

Latest Patent Applications

One of his notable patent applications is for an "Information Recording/Reproducing Apparatus." This apparatus includes a reproduction period list reader that reads a reproduction period list from a recording medium. It also features a specific-time skipping device that allows for skipping a reading-out position of information over a prescribed time. Additionally, a reproduction period list modifier is included, which deletes a skip period from a reproduction period in the list when specific-time skipping is performed during the reproduction of information.

Conclusion

Chikashi Hayashi's work in the realm of information recording technology showcases his innovative spirit and dedication to advancing the field. His patent application reflects a thoughtful approach to improving how information is accessed and reproduced.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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