Shanghai, China

Chihhong Liu

This inventor holds 1 USPTO granted patent. Top assignee: Everdisplay Optronics (Shanghai) Limited. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chihhong Liu. Retrieved from https://idiyas.com/inventor/chihhong-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Chihhong Liu - Innovator in OLED Technology

Introduction

Chihhong Liu is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of organic light-emitting diodes (OLED) technology. His innovative approach has led to advancements that enhance the performance of OLED structures.

Latest Patents

Chihhong Liu holds a patent for a method aimed at improving the reflectivity of aluminum in OLED structures. The patent, titled "Method for improving the reflectivity of aluminum in OLED structure," outlines a process that includes forming a bottom indium tin oxide (ITO) layer, coating an aluminous reflective layer, and creating an aluminum oxide layer to enhance reflectivity. This method effectively repairs defects on the surface of the aluminum film, leading to improved performance in OLED applications. He has 1 patent to his name.

Career Highlights

Chihhong Liu is currently employed at Everdisplay Optronics (Shanghai) Limited, where he continues to work on innovative solutions in the field of display technology. His expertise in OLED structures has positioned him as a valuable asset to the company.

Collaborations

Chihhong Liu collaborates with his coworker, Chenghsien Wang, to further advance their research and development efforts in OLED technology.

Conclusion

Chihhong Liu's contributions to OLED technology through his innovative patent demonstrate his commitment to enhancing display performance. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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