Kaohsiung, Taiwan

Chih-Ying Yen

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Ying Yen. Retrieved from https://idiyas.com/inventor/chih-ying-yen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Chih-Ying Yen in Manufacturing Processes

Introduction

Chih-Ying Yen is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of manufacturing processes through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of monitoring and controlling reactants during manufacturing.

Latest Patents

Chih-Ying Yen holds a patent titled "System and method for monitoring and controlling multi-phase condition of reactants in manufacturing process." This patent describes a method that includes capturing a plurality of clusters of monitoring images corresponding to various process reaction time points in multiple observation regions. The method involves extracting image index features from these clusters and determining phase modes based on these features. Furthermore, it allows for the adjustment of the manufacturing process according to the generation characteristics of the reactants.

Career Highlights

Chih-Ying Yen is associated with the Industrial Technology Research Institute, where he applies his expertise to advance manufacturing technologies. His work is instrumental in improving the processes that are critical to various industries.

Collaborations

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Conclusion

Chih-Ying Yen's innovative approach to monitoring and controlling manufacturing processes showcases his commitment to advancing technology in this field. His patent reflects a significant step forward in enhancing manufacturing efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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