Hsinchu, Taiwan

Chih Yao Chen

This inventor holds 1 USPTO granted patent. Top assignee: Hermes-Epitek Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih Yao Chen. Retrieved from https://idiyas.com/inventor/chih-yao-chen-8li6nwe2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Innovations by Chih Yao Chen

Introduction

Chih Yao Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of technology, particularly in the development of probe card structures. His innovative work has led to the creation of a patent that enhances testing processes in various specifications.

Latest Patents

Chih Yao Chen holds a patent for a "Probe card structure adaptable to different test apparatuses of different specifications." This invention includes a probe card designed for a first specification, a reinforcement member for a second specification, and a specification conversion interface unit that connects the two. This design allows for flexibility in testing processes, enabling the probe card to be mounted on test apparatuses of different specifications efficiently.

Career Highlights

Chih Yao Chen is currently associated with Hermes-Epitek Corporation, where he continues to innovate and contribute to advancements in technology. His work has been instrumental in improving the efficiency and adaptability of testing equipment.

Collaborations

Chih Yao Chen collaborates with his coworker, Chien-Yao Hung, to further enhance their research and development efforts. Their teamwork has led to significant advancements in their field.

Conclusion

Chih Yao Chen's contributions to the field of technology through his innovative patent demonstrate his commitment to improving testing processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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