Hsinchu, Taiwan

Chih Yao Chang

This inventor holds 1 USPTO granted patent. Top assignee: Wistron Neweb Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih Yao Chang. Retrieved from https://idiyas.com/inventor/chih-yao-chang-e6ullx3i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Chih Yao Chang

Introduction

Chih Yao Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of radio frequency technology. His work focuses on enhancing the performance and calibration of RF transceivers.

Latest Patents

Chih Yao Chang holds a patent for a "Calibration method and calibration system for radio frequency transceiver." This innovative method involves configuring a controller to perform a series of transmission tests on the RF transceiver. The process generates model test results to select a target calibration model from various reference calibration models. Additionally, it includes selecting a target parameter set and a target simulation circuit to optimize the RF transceiver's performance.

Career Highlights

Chih Yao Chang is currently employed at Wistron Neweb Corporation, where he continues to develop cutting-edge technologies in the RF domain. His expertise in calibration methods has positioned him as a valuable asset to his team and the company.

Collaborations

Chih Yao Chang collaborates with his coworker, Chen-Shu Peng, to further advance their projects and innovations in the field of radio frequency technology.

Conclusion

Chih Yao Chang's contributions to the calibration of RF transceivers demonstrate his commitment to innovation and excellence in technology. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…