Company Filing History:
Years Active: 2023
Title: Chih-Wei Wen: Innovator in Probe Card Technology
Introduction
Chih-Wei Wen is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of probe card technology, which is essential for semiconductor testing. His innovative approach has led to the development of a unique probe card design that enhances testing efficiency.
Latest Patents
Chih-Wei Wen holds a patent for a "Probe card and probe module thereof." This invention includes a probe card that features a first strengthening board, a fixed frame, a probe module, and a slidable frame. The design incorporates a mounting hole with an inner flange, allowing for improved functionality and stability during testing processes.
Career Highlights
Wen is currently employed at Mpi Corporation, where he continues to advance his research and development efforts in semiconductor technology. His work has been instrumental in enhancing the performance and reliability of probe cards used in various applications.
Collaborations
Chih-Wei Wen collaborates with talented colleagues, including Chung-Yen Huang and Sheng-Feng Xu. Together, they contribute to innovative projects that push the boundaries of technology in their field.
Conclusion
Chih-Wei Wen's contributions to probe card technology exemplify his dedication to innovation and excellence. His patent and ongoing work at Mpi Corporation highlight his role as a key player in the semiconductor industry.