Chih-Lieh Chen

Title: Innovations by Chih-Lieh Chen

Introduction

Chih-Lieh Chen is a notable inventor based in Dongshan, Taiwan. He has made significant contributions to the field of optical inspection technology, particularly in the semiconductor industry. With a total of 3 patents to his name, Chen's work has advanced the methods used for wafer inspection.

Latest Patents

One of Chih-Lieh Chen's latest patents focuses on the optical inspection of a wafer. This invention involves an image analysis device that aligns an image to determine the position of a wafer within that image. The wafer may include a plurality of wafer bumps. The image analysis device masks the image based on the wafer's position to obtain an image of a portion of the wafer. It then binarizes this image to create a binarized representation of the portion. The device determines a bump pattern associated with the wafer bumps based on the binarized image. Furthermore, it performs a defect analysis of the determined bump pattern, which helps in detecting regions where one or more wafer bumps have abnormal heights.

Career Highlights

Chih-Lieh Chen is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work there has been instrumental in enhancing the quality and reliability of semiconductor manufacturing processes.

Collaborations

Chen has collaborated with notable colleagues, including Cheng-Kang Hu and Cheng-Lung Wu, contributing to various projects that aim to improve optical inspection techniques.

Conclusion

Chih-Lieh Chen's innovations in optical inspection technology have made a significant impact on the semiconductor industry. His patents reflect a commitment to advancing the methods used in wafer inspection, ensuring higher quality standards in semiconductor manufacturing.