Pingzhen, Taiwan

Chih-Hao Yang

This inventor holds 1 USPTO granted patent. Top assignee: Optimax Technology Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Hao Yang. Retrieved from https://idiyas.com/inventor/chih-hao-yang-rue7ehmq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Chih-Hao Yang

Introduction

Chih-Hao Yang is a notable inventor based in Ping Chen, Taiwan. He has made significant contributions to the field of optical technology, particularly in the measurement of optical sheet curls. His innovative approach has led to advancements in measuring accuracy and speed.

Latest Patents

Chih-Hao Yang holds a patent for an "Apparatus and methods for automatically measuring a curl of an optical sheet." This invention involves a conveyor belt that moves an optical sheet while at least one beam is configured above it. When the beam is intersected by the moving optical sheet, it indicates that the optical sheet is curled. This invention achieves automatic in-line measuring of optical sheet curls through precise optical measurement, enhancing both measuring accuracy and speed. He has 1 patent to his name.

Career Highlights

Chih-Hao Yang is associated with Optimax Technology Corporation, where he applies his expertise in optical technology. His work has been instrumental in developing methods that improve the efficiency of optical measurements.

Collaborations

Chih-Hao Yang has collaborated with notable colleagues, including Jye-Jong Chen and Bor-Ping Wang. Their combined efforts contribute to the innovative projects at Optimax Technology Corporation.

Conclusion

Chih-Hao Yang's contributions to optical technology through his patent and work at Optimax Technology Corporation highlight his role as an influential inventor in the field. His innovations continue to enhance the accuracy and efficiency of optical measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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