This inventor holds 1 USPTO granted patent. Top assignee: Nan Ya Technology Corporation. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Innovations of Chih-Feng Wang in Post-CMP Cleaning Technology
Introduction
Chih-Feng Wang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of cleaning technology, particularly in the semiconductor industry. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of post-CMP cleaning processes.
Latest Patents
Chih-Feng Wang holds a patent for an "Apparatus for assembling a post-CMP cleaning brush." This invention is designed to facilitate the assembly of a cleaning brush that is essential for maintaining the cleanliness of semiconductor wafers after chemical mechanical polishing (CMP). The apparatus includes a base, a fixed member, a sliding member, multiple posts, and an actuating device. This design allows for the effective assembly of the brush core and outer brush, ensuring optimal performance in cleaning applications.
Career Highlights
Wang is currently employed at Nan Ya Technology Corporation, where he continues to innovate and contribute to advancements in cleaning technologies. His work has been instrumental in improving the efficiency and effectiveness of cleaning processes in the semiconductor manufacturing sector.
Collaborations
Chih-Feng Wang has collaborated with notable colleagues, including Ming Fa Tsai and Hong-wei Chen. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Chih-Feng Wang's contributions to post-CMP cleaning technology exemplify the importance of innovation in the semiconductor industry. His patent and ongoing work at Nan Ya Technology Corporation highlight his commitment to advancing cleaning technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile