Jhubei, Taiwan

Chih-Che Lin

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Semiconductor Manufacturing Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Che Lin. Retrieved from https://idiyas.com/inventor/chih-che-lin-3gzu2nlm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chih-Che Lin and Semiconductor Contamination Handling

Introduction

Chih-Che Lin is an inventor based in Jhubei, Taiwan. He is associated with Taiwan Semiconductor Manufacturing Co., Ltd. His patent work addresses contamination monitoring and process control in semiconductor lithography equipment.

Latest Patents

Lin is credited with 1 patent: “Contamination Handling for Semiconductor Apparatus.” The patent describes a lithography apparatus with a photoresist coating unit that performs coating processes on a substrate. A detection unit measures contamination from those processes on the apparatus’s sidewall. A controller then adjusts equipment operations by comparing the measured contamination level with a baseline cleanliness requirement.

Career Highlights

Lin’s disclosed invention focuses on detecting contamination and using that information to guide lithography apparatus operations. This approach connects equipment cleanliness monitoring with process adjustments in semiconductor manufacturing.

Collaborations

The provided information lists Fu-Chun Hsieh and Pei-Yi Su as Lin’s coworkers. Their specific contributions to the patent are not stated.

Conclusion

Chih-Che Lin’s patent highlights a practical approach to monitoring contamination and adjusting semiconductor lithography equipment to meet cleanliness requirements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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