Chih Chang Chen

Title: Chih Chang Chen: Innovator in Electromagnetic Susceptibility Testing

Introduction

Chih Chang Chen is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of electromagnetic susceptibility testing through his innovative methods. His work emphasizes the integration of computer vision technology in testing electronic devices.

Latest Patents

Chih Chang Chen holds a patent for an "Electromagnetic susceptibility testing method based on computer-vision." This method includes a training stage and a testing stage. During the training stage, the electronic device receives testing data, and the monitor displays a first picture. A camera captures this first picture to generate a template video. The processor then generates a plurality of template images based on the template video. In the testing stage, an antenna emits an interference signal to the electronic device. The device receives testing data, and the monitor displays a second picture. The camera captures this second picture to generate a testing video. The processor generates a testing image from the testing video and calculates a difference ratio between the testing image and each template image. An alert signal is sent when the difference ratio exceeds a predetermined threshold.

Career Highlights

Chih Chang Chen has worked with prominent companies in the technology sector, including Inventec Corporation and Inventec (Pudong) Technology Corporation. His experience in these organizations has contributed to his expertise in electromagnetic testing methods.

Collaborations

Chih Chang Chen has collaborated with talented individuals such as Trista Pei-Chun Chen and Hsin-Hung Lin. Their teamwork has fostered innovation and advancements in their respective fields.

Conclusion

Chih Chang Chen's contributions to electromagnetic susceptibility testing highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in the integration of computer vision in testing methodologies.