Chien-Kai Wang

Title: Chien-Kai Wang: Innovator in Atomic Resolution Measurement

Introduction

Chien-Kai Wang is a notable inventor based in Providence, RI (US). He has made significant contributions to the field of atomic resolution measurement, particularly through his innovative patent.

Latest Patents

Wang holds a patent for a "Device and method for measuring distribution of atomic resolution deformation." This invention relates to an atomic resolution deformation distribution measurement device that can measure a deformation rate at an atomic scale with low expense. The device improves resolution using an AFM system and includes several key components: a laser source generating a laser beam, a first and second cantilever positioned close to a measurement specimen or a reference specimen, an optical system controlling the light path of the laser beam, a measurement unit for measuring the reflected laser beam, and a stage for positioning the measurement specimen or reference specimen.

Career Highlights

Throughout his career, Chien-Kai Wang has worked with esteemed institutions such as the Korea Institute of Machinery and Materials and Brown University. His work has focused on advancing measurement techniques that enhance our understanding of atomic-scale deformations.

Collaborations

Wang has collaborated with notable colleagues, including Bong Kyun Jang and Jae-Hyun Kim, contributing to the advancement of technology in his field.

Conclusion

Chien-Kai Wang's innovative work in atomic resolution measurement exemplifies the impact of dedicated inventors in advancing scientific understanding. His contributions continue to influence the field and inspire future innovations.