Taoyuan, Taiwan

Chien-Hung Lo


Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 5(Granted Patents)


Location History:

  • Taoyuan County, TW (2018)
  • Taoyuan, TW (2019)

Company Filing History:


Years Active: 2018-2019

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2 patents (USPTO):Explore Patents

Title: Innovations of Chien-Hung Lo

Introduction

Chien-Hung Lo is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of electronic component testing, holding a total of 2 patents. His work focuses on enhancing the efficiency and reliability of testing devices.

Latest Patents

Chien-Hung Lo's latest patents include a dew resistant module for test sockets and an electronic component testing device that incorporates this module. This innovative dew resistant module features an enclosure body that surrounds the test socket, along with a test socket base plate positioned on top. A cover is designed to shield the test socket, enclosure body, and base plate from direct atmospheric contact, effectively preventing condensation and minimizing energy consumption.

Another significant patent is the dual loop type temperature control module, which is part of an electronic device testing apparatus. This module consists of two loops for different working fluids, allowing precise temperature regulation. The temperature regulating device adjusts a thermoelectric cooling device to maintain two distinct reference temperatures, facilitating accurate high and low-temperature detection for tested objects.

Career Highlights

Chien-Hung Lo is currently employed at Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work at Chroma Ate Inc. has positioned him as a key player in the development of innovative testing technologies.

Collaborations

Chien-Hung Lo collaborates with talented coworkers, including Xin-Yi Wu and Jui-Chih Chou. Their combined expertise contributes to the advancement of testing technologies in the electronics industry.

Conclusion

Chien-Hung Lo's contributions to electronic component testing through his innovative patents demonstrate his commitment to improving technology in this field. His work not only enhances testing efficiency but also addresses critical issues such as condensation and temperature regulation.

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