Chien Fang Huang

Title: Chien Fang Huang: Innovator in Wafer Testing Technologies

Introduction

Chien Fang Huang is a prominent inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in wafer testing systems. With a total of 4 patents to his name, Huang's work has advanced the efficiency and effectiveness of testing processes in the semiconductor industry.

Latest Patents

Huang's latest patents include innovative methods and systems that enhance wafer testing. One of his notable inventions is a wafer test system and methods, which involves positioning a wafer in a first probe chamber using a robot arm. This system allows for efficient testing and subsequent cooling of the wafer before transferring it to a second probe chamber. Another significant patent is related to the probe card needle shape and method of manufacturing. This method focuses on refining and processing conductive bodies to create various needle tips for probe cards, utilizing electrolytic fluid to achieve precise shapes and profiles.

Career Highlights

Throughout his career, Chien Fang Huang has worked with leading companies in the semiconductor industry, including Taiwan Semiconductor Manufacturing Company Limited. His expertise in wafer testing and manufacturing processes has positioned him as a key figure in advancing semiconductor technologies.

Collaborations

Huang has collaborated with notable professionals in his field, including Yi-Neng Chang and Ting-Yu Chiu. These collaborations have contributed to the development of innovative solutions in wafer testing and manufacturing.

Conclusion

Chien Fang Huang's contributions to the semiconductor industry through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of wafer testing technologies, making significant strides in the efficiency of semiconductor manufacturing processes.